Threshold Voltage Instability in A-Si:H TFTS and the Implications for Flexible Displays and Circuits

Abstract

After a brief review of the characteristics of electrical stress degradation of flexible, amorphous silicon thin film transistors, the implications for various types of flexible circuitry including active matrix backplanes, integrated drivers and general purpose digital circuitry are examined. A circuit modeling tool that enables the prediction of complex circuit degradation is presented. Experimental results for a variety of flexible digital circuits including programmable logic arrays and memories are presented. Finally, we discuss the principal remaining challenges to building a fully flexible electronic system.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 2008
Accession Number
ADA505761

Entities

People

  • D. Morton
  • David R. Allee
  • E. Bawolek
  • E. Forsythe
  • G. Raupp
  • K. Baugh
  • Lawrence T. Clark
  • N. Darbanian
  • R. Shringarpure
  • S. Venugopal
  • Zheng Li

Organizations

  • Arizona State University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Amplifiers
  • Circuits
  • Degradation
  • Digital Circuits
  • Electronics
  • Energy Consumption
  • Films
  • Low Temperature
  • Materials
  • Materials Processing
  • Operational Amplifiers
  • Semiconductors
  • Simulators
  • Stainless Steel
  • Thin Film Transistors
  • Thin Films
  • Transistors

Readers

  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics