Modeling of Thermal Stress Build-up During Processing of Multi-layer Micro-dynamical Systems

Abstract

The present investigation is devoted to the finite element modeling of stress buildup during processing of multi-layered microdynamical devices. Modeling is performed with the commercial software package Mark-Mentat. Mechanical properties of materials during modeling are assumed to be elastic. In the current modeling, only the final composite structure is considered. However, to imitate the thermal cycling that occurs during deposition or etching of layers, elastic time-dependent material parameters are used. Development of this model gives a means to predict the distortion of multi-layered devices due to residual stresses.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 2002
Accession Number
ADA506944

Entities

People

  • A. Maximenko
  • E. Olevsky
  • M. E. Aklufi
  • R. L. Waters
  • R. R. Kline

Organizations

  • Naval Information Warfare Systems Command

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Ceramic Materials
  • Composite Materials
  • Composite Structures
  • Computer Programs
  • Distortion
  • Engineering
  • Fabrication
  • Integrated Circuits
  • Materials
  • Mechanical Properties
  • Microelectromechanical Systems
  • Physical Properties
  • Residual Stress
  • Residuals
  • Semiconductor Manufacturing
  • Stresses
  • Thermal Stresses

Fields of Study

  • Engineering

Readers

  • Computational Modeling and Simulation
  • Nanofabrication and Microfabrication.
  • Structural Dynamics.