Prediction and Measurement of Induced Voltages Inside Complicated Enclosures using Wave-Chaos

Abstract

This briefing looks at four questions: 1) Is there some fast, simple and accurate way to predict the voltages induced at specific points within a complicated metallic enclosure (e.g. computer-box) due to external radiation? 2) What factors determine the nature of these induced voltages? 3) Is there some "optimally shaped" wave-form for the external radiation, for which the electronics within the enclosure is most susceptible? 4) Is it possible to engineer an enclosure to make it resistant to HPM attack?

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 2006
Accession Number
ADA509637

Entities

People

  • Chris Bertrand
  • Edward Ott
  • James L Hart
  • Michael J. Johnson
  • Sameer Hemmady
  • Steven M Anlage
  • Thomas M. Antonsen Jr.
  • Xing Zheng

Organizations

  • University of Maryland

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Abstracts
  • Algorithms
  • Computers
  • Couplings
  • Electronics
  • Engineering
  • Engineers
  • Experimental Data
  • Frequency
  • Impedance
  • Information Operations
  • Measurement
  • Microwaves
  • Radiation
  • Scattering
  • Waveforms
  • Waves

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Explosive Engineering.
  • Plasma Physics / Magnetohydrodynamics

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene
  • Microelectronics - Microelectromechanical Systems