TF-05-013 FY05 HAST Evaluation Report
Abstract
This report summarizes the results of an extensive HAST evaluation of plastic encapsulated microcircuits (PEMs) involving multiple manufacturers of similar device types in the same IC package. The purpose of this evaluation was to gain some insight on the following questions: (1) Are apparent delaminated areas of PEMs critically significant?; (2) Are manufacturers assigning the appropriate moisture sensitivity levels (MSL)?; (3) Has overall PEM construction quality and reliability improved?; (4) Does PEM quality and reliability still vary from lot to lot and manufacturer to manufacturer? The data acquired from this evaluation was compared to historical data obtained from similar evaluations performed in the early 1990's and later. These particular devices are equivalent device types and IC package types to those commonly used in many military systems in the mid 1990's. The evaluated devices devices are listed in Table 1 and the test flows are shown in Figure 1.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 2005
- Accession Number
- ADA515030
Entities
Organizations
- Naval Surface Warfare Center