Local Oscillator Induced Degradation of Medium-Term Stability in Passive Atomic Frequency Standards

Abstract

As the performance of passive atomic frequency standards improves, a new limitation is encountered due to frequency fluctuations in an ancillary local oscillator (L.O.). The effect is due to time variation in the gain of the feedback which compensates L.O. frequency fluctuations. The high performance promised by new microwave and optical trapped ion standard may be severely compromised by this effect. We present un anabsk of this performance limitation for the case of sequentially interrogated standards. The time dependence of the sensitivity of the interrogation process to L.O. frequency fluctuations is evaluated for single-pulse and double-puke "Ramsey" RF interrogation and also for amplitude modulated pulses.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1990
Accession Number
ADA515721

Entities

People

  • C. A. Greenhall
  • G. J. Dick
  • J. D. Prestage
  • L. Maleki

Organizations

  • California Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Dead Time
  • Degradation
  • Detectors
  • Frequency
  • Frequency Shift
  • Frequency Standards
  • Jet Propulsion
  • Local Oscillators
  • Magnetic Fields
  • Optical Detectors
  • Oscillators
  • Phase Shift
  • Radio Frequency Pulses
  • Resonant Frequency
  • Standards
  • Three Dimensional
  • Time Dependence

Fields of Study

  • Physics

Readers

  • Electronics Engineering
  • Pulsed Power and Plasma Physics.
  • Systems Analysis and Design