Real Time Fault Detection and Diagnostics Using FPGA-Based Architectures

Abstract

Errors within circuits caused by radiation continue to be an important concern to developers. A new methodology of real time fault detection and diagnostics utilizing FPGA based architectures while under radiation were investigated in this research. The contributions of this research are focused on three areas; a full test platform to evaluate a circuit while under radiation, an algorithm to detect and diagnose fault locations within a circuit, and finally to characterize Triple Design Triple Modular Redundancy (TDTMR), a new form of TMR. Five different test setups, injected fault test, gamma radiation test, thermal radiation test, optical laser test, and optical flash test, were used to assess the effectiveness of these three research goals. Based on the five tests, the testing platform operated successfully. The detection and diagnosis algorithm was able to detect errors. The injected fault test was the only test that was able to properly diagnosis the location of the fault. The results also unexpectedly showed that the voting unit failed before any of the adders while under radiation. Dose rate versus total dose has a differing effect on the DUT. The goals of this research was met by completing a fully interchangeable and operational testing platform, an algorithm that detects and diagnosis errors in real time, and an initial evaluation of TDTMR.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 2010
Accession Number
ADA517271

Entities

People

  • Nathan P. Naber

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Engineered Resilient Systems

DTIC Thesaurus Topics

  • Air Force
  • Alpha Particles
  • Application-Specific Integrated Circuits
  • Complementary Metal-Oxide Semiconductors
  • Cosmic Rays
  • Detection
  • Dose Rate
  • Field Programmable Gate Arrays
  • Gamma Rays
  • Integrated Circuits
  • Ionizing Radiation
  • Radiation Effects
  • Semiconductors
  • Spacecraft
  • Test And Evaluation
  • Test Methods
  • Thermal Radiation

Fields of Study

  • Engineering

Readers

  • Applied Combinatorial Optimization and Logic Circuit Design.
  • Electrical Engineering
  • Pulsed Power and Plasma Physics.

Technology Areas

  • Directed Energy