Microstructural Characterization of YBa2Cu3O7-x Films with BaZrO3 Nanorods Grown on Vicinal SrTiO3 Substrates (Postprint)

Abstract

When grown on miscut SrTiO3 substrates, significant microstructural changes are observed in BaZrO3-doped YBa2Cu3O7-x thin films when compared to those on non-vicinal substrates. Scanning Electron Microscopy indicates a surface morphology strongly influenced by the vicinal angle, and an accumulation of BaZrO3 particles is observed near the step edges. Cross-sectional Transmission Electron Microscopy reveals that while the columnar formations of BaZrO3 rods typically seen on non-vicinal substrates are present, a significant increase in planar defects in a 10 vicinal film are observed. The effects observed with increasing miscut angle indicate that the modulated surface provided by the vicinal substrate influences the crystalline quality of the YBCO matrix and BZO columnar formation through the thickness of the film.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 2010
Accession Number
ADA519632

Entities

People

  • F. J. Baca
  • Joshua Reichart
  • Judy Z. Wu
  • Paul N. Barnes
  • Rose L. Emergo
  • Timothy J. Haugan

Organizations

  • Air Force Research Laboratory

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  • Advanced Electronics

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  • Thin Films

Fields of Study

  • Materials science
  • Physics

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  • Nanofabrication and Microfabrication.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene