Collaborative Research and Development (CR&D). Delivery Order 0051: Atomic Scale Transmission Electron Microscope Image Modeling and Application to Semiconductor Heterointerface Characterization

Abstract

This research in support of the Air Force Research Laboratory Materials and Manufacturing Directorate was conducted from 19 May 2006 through 31 January 2008. This task developed and used computer models of electron beam transmission through complex semiconductor heterostructures to determine the interface compositions in real images, and to study how growth and/or processing conditions affect the layers and interfaces. The techniques and models developed, as well as the results of applications of these models to AFRL/MLPS-provided semiconductor samples are reported.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2008
Accession Number
ADA519972

Entities

People

  • K. Mahalingam

Organizations

  • Universal Technology Corporation (United States)

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Air Force Research Laboratories
  • Chemical Vapor Deposition
  • Electron Microscopes
  • Electron Microscopy
  • Electronics Laboratories
  • Electrons
  • Heterojunctions
  • High Electron Mobility Transistors
  • High Resolution
  • Materials
  • Microscopes
  • Microscopy
  • Quantum Cascade Lasers
  • Quantum Dots
  • Semiconductors
  • Transmission Electron Microscopy

Readers

  • Aerospace Research.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics