Opto-Mechanical and Electronic Design of a Tunnel-Trap Si Radiometer

Abstract

A transmission-type light-trap silicon radiometer has been developed to hold the NIST spectral power and irradiance responsivity scales between 406 nm and 920 nm. The device is built from replaceable input apertures and tightly packed different-size silicon photodiodes. The photodiodes are positioned in a triangular shape tunnel such that beam clipping is entirely eliminated within an 8 field-of-view (FOV). A light trap is attached to the output of the radiometer to collect the transmitted radiation and to minimize the effect of ambient light. The photodiodes, selected for equal shunt resistance, are connected in parallel. The capacitance and the resultant shunt resistance of the device were measured and frequency compensations were applied in the feedback network of the photo-current-to-voltage converter to optimize signal-, voltage-, and loop-gain characteristics. The trap radiometer can measure either dc or ac optical radiation with high sensitivity. The noise-equivalent-power of the optimized device is 47 fW in dc mode and 5.2 fW at 10 Hz chopping. The relative deviation from the cosine responsivity in irradiance mode was measured to be equal to or less than 0.02% within 5 deg. FOV and 0.05% at 8 deg. FOV. The trap-radiometer can transfer irradiance responsivities with uncertainties comparable to those of primary standard radiometers. Illuminance and irradiance meters, holding the SI units (candela, color- and radiance-temperature), will be calibrated directly against the transfer standard trap-radiometer to obtain improved accuracy in the base-units.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2000
Accession Number
ADA520225

Entities

People

  • Donald C. Lynch
  • George P. Eppeldauer

Organizations

  • National Institute of Standards and Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Air Force
  • Amplifiers
  • Attenuation
  • Bandwidth
  • Capacitance
  • Control Systems
  • Detectors
  • Dynamic Range
  • Impedance
  • Measurement
  • Operational Amplifiers
  • Quantum Efficiency
  • Radiation
  • Radiometers
  • Resistance
  • Standards

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Image Processing and Computer Vision.
  • Semiconductor Device Technology

Technology Areas

  • Directed Energy
  • Microelectronics
  • Microelectronics - Microelectromechanical Systems