Development of Nano-Slit for High-Resolution Detection of Atoms Using Near-Field Lights
Abstract
The researchers made a slit-shaped structure with the width of 50 nm working as an atom detector. We estimated from finite difference time domain simulations that the radius of curvature of less than 32 nm was required as the machining accuracy of the edge for detecting cold Rb atoms. Near-field light overcoming the diffraction limit can be applied to atomic-level deposition. Actually, we have developed an atom deflector using a repulsive dipole force from near-field light [1,2]. In the first demonstration, researchers used the two-step photoionization with a diode laser beam and an Ar-ion laser beam to detect deflected Rb atoms. However, since the spatial resolution was very low, about 100 micrometers, we were not able to check the diffraction pattern in detail. The atom detection system with high spatial accuracy exceeding 100 nm is essential to near-field optical manipulation of atoms. Unfortunately, there is no commercial detector with a resolution over 10 micrometers to our knowledge. To this end, we develop an atom detector required for atom-manipulation experiments with near-field light.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 20, 2010
- Accession Number
- ADA520993
Entities
People
- Haruhiko Ito
Organizations
- Tokyo Institute of Technology