Experimental Study of EMP Upset Mechanisms in Analog and Digital Circuits

Abstract

Outline and Motivation 1) Out-of-band frequency response in communications circuits: a) Effect of parasitic elements on network performance; b) Degradation in filter rejection ratios; c) EMP propagation on signal path; d) Need for wideband circuit characterization and verification throughout the communications network (RF and IF path, mixer, A/D, power vias, etc.). 2) Experimental study of device upset using direct RF injection: a) Identify RF characteristics that produce bit errors, latch-up; b) What are the EMP effects at the device level? c) Modulation and nonlinear circuit response. 3) Directions to pursue: a) Experiment; b) Modeling.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 2006
Accession Number
ADA521755

Entities

People

  • John Rodgers
  • Michael G Walter
  • T. M. Firestone
  • V. L. Granatstein

Organizations

  • University of Maryland

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Abstracts
  • Acoustic Waves
  • Circuits
  • Detectors
  • Digital Circuits
  • Digital Communications
  • Filters
  • Frequency
  • Frequency Response
  • Modulation
  • Networks
  • Radio Frequency Detectors
  • Radio Frequency Pulses
  • Signal Generators
  • Surface Acoustic Waves
  • Test Facilities
  • Universities

Readers

  • Integrated Circuit Design and Technology.
  • Microwave Engineering.
  • Optical Fiber Sensing and Electromagnetic Propagation.