Experimental Studies of Vulnerabilities in Devices and On-Chip Protection

Abstract

Objectives of this research: * Study effects on the fundamental units of IC circuits, ie individual devices (MOSFETs) and gates (CMOS Inverters). * Identify most prominent vulnerabilities of the units to RF direct injection and irradiation, and examine how they critically affect circuit operation. * Establish the failure mechanisms for each regime and develop hardened IC device/circuit designs. * Evaluate response of device with RF pulse parameters and use MOSFET devices as on-chip sensing and protecting elements. * Develop on-chip sensing, registration, and protection circuitry. * Develop protective nano-composite polymer based "spin-on" coatings.

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Document Details

Document Type
Technical Report
Publication Date
Jun 08, 2006
Accession Number
ADA521906

Entities

People

  • Agis A. Iliadis
  • J. Rodgers
  • Kai Zhang
  • Kyechong Kim
  • T. Firestone
  • Xingzhi Wen
  • Y. Carmel

Organizations

  • University of Maryland

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Abstracts
  • Amplitude
  • Coatings
  • Composite Materials
  • Elements
  • Engineering
  • Fabrication
  • Failure Mode And Effect Analysis
  • Frequency
  • Information Operations
  • Linearity
  • Nanocomposites
  • Radiation
  • Radio Frequency Pulses
  • Simulations
  • Universities
  • Vulnerability

Readers

  • Integrated Circuit Design and Technology.
  • Nanocomposite Materials Science
  • Systems Analysis and Design