Friction in Full View

Abstract

We have used an in situ transmission electron microscopy (TEM) technique to perform tribological investigations on various thin films. Using a Nanofactory HSIOO STM-TEM sample holder and Tecnai F20ST TEM (200 kV), we were able to slide sharp probe tips on samples to study the single-asperity behavior. During sliding we were able to simultaneously use the various instrumentation of the TEM, including bright and dark field imaging, electron diffraction, and chemical analysis in the form of ED X and EELS at high resolution.

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Document Details

Document Type
Technical Report
Publication Date
May 19, 2010
Accession Number
ADA523369

Entities

People

  • Laurence D. Marks

Organizations

  • Northwestern University

Tags

Communities of Interest

  • Air Platforms
  • Energy and Power Technologies
  • Space

DTIC Thesaurus Topics

  • Chemical Analysis
  • Creep
  • Diffraction
  • Electron Diffraction
  • Electron Microscopy
  • Electrons
  • Films
  • Friction
  • Grain Growth
  • Grain Size
  • Graphitic Materials
  • High Resolution
  • Instrumentation
  • Materials
  • Microscopy
  • Thin Films
  • Transmission Electron Microscopy

Readers

  • Nanofabrication and Microfabrication.
  • Tribology (the study of the boundary interaction between sliding surfaces, lubrication, wear and friction).
  • Vision Science/Vision Psychology/Cognitive Neuroscience.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene