Ohmic Contacts for Technology for Frequency Agile Digitally Synthesized Transmitters

Abstract

Researchers at The Pennsylvania State University have investigated ohmic contacts to p-InGaAs and n-InGaAs, which are needed for heterojunction bipolar transistors. They have refined an electroless deposition process for ohmic contacts to p-InGaAs in which the metals selectively deposit on the semiconductor but not on dielectric layers such as silicon nitride. This process produces contacts with a low specific contact resistance and offers the potential for self-aligned contacts. The researchers have also investigated the factors that affect the resistance of contacts to InGaAs, including premetallization surface preparation and method of deposition, and have analyzed errors involved with extracting very low specific contact resistances. This work has resulted in the recognition of reproducible trends in contact resistance with processing conditions as well as insight into how to more accurately measure the specific contact resistance of very low-resistance contacts.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 2010
Accession Number
ADA525603

Entities

People

  • Suzanne E Mohney

Organizations

  • Pennsylvania State University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Bipolar Junction Transistors
  • Ceramic Materials
  • Compound Semiconductors
  • Electron Microscopy
  • Electronics
  • Frequency
  • Heterojunction Bipolar Transistors
  • Measurement
  • Metal-Semiconductor Junctions
  • Metals
  • Pennsylvania
  • Resistance
  • Semiconductor Devices
  • Semiconductors
  • Simulations
  • Transistors
  • Universities

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene