Extraction of Semiconductor Microchip Differential Gain by Use of Optically Pumped Semiconductor Laser (POSTPRINT)

Abstract

The small-signal modulation response of a vertical external cavity surface emitting laser is analyzed to determine its resonance frequency in relation to photon density, allowing nondestructive extraction of characteristic parameters of chips, such as internal loss and differential gain.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 2009
Accession Number
ADA531646

Entities

People

  • Jerome V. Moloney
  • Joerg Hader
  • Matthew Walton
  • Nathan Terry
  • Robert Bedford

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Air Force Research Laboratories
  • Detectors
  • Distributed Bragg Reflectors
  • Electronics Laboratories
  • Extraction
  • Frequency
  • Integrated Circuits
  • Lasers
  • Military Research
  • Modulation
  • Optically Pumped Semiconductor Lasers
  • Resonance
  • Resonant Frequency
  • Semiconductor Lasers
  • Semiconductors
  • Surface Emitting Lasers

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
  • Systems Analysis and Design

Technology Areas

  • Directed Energy
  • Microelectronics