Collaborative Research and Development (CR&D). Task Order 0036: Physical and Chemical Processes of Operating Electronic Devices
Abstract
This research in support of the Air Force Research Laboratory, Materials and Manufacturing Directorate was conducted at Wright-Patterson AFB, Ohio from 12 July 2005 through 25 August 2006. Models were developed to validate physical and chemical processes that occur during the operation of wide bandgap electronic devices. Efforts have focused on AlGaN/GaN HEMT devices, and on aspects of the problem which impact device reliability estimates, such as internal temperature profiles, charge trapping, and electric fields. The bulk of the effort has relied on utilizing commercial electrothermal and thermal finite element simulators, and details of the practical use of two of these simulators is discussed.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 2006
- Accession Number
- ADA534545
Entities
People
- Eric R. Heller
Organizations
- Universal Technology Corporation (United States)