Morphology and Mechanism of Benign Inhibitors

Abstract

Neutron and x-ray reflectivity are used to determine the composition profile of vanadate and trivalent chromium process (TCP) inhibitor films. In both cases, the films have a complex structure consisting of at least two layers. For vanadate films, a porous, hydrophilic layer exists at the interface between the film and the metal substrate. For TCP films, the interfacial layer is very thin and dense if the film is deposited electrochemically. The films also differ in hydration. Vanadate films are un-hydrated whereas TCP films exist as hydrates of the form Crf2O3-4H2O. In both cases, the bulk of the films is not fully dense. Densification is observed, however, at high temperature and when dried after exposure to liquid water. The differences in film morphology imply different mechanisms of film formation. Mechanisms are described that are consistent with the observations.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2009
Accession Number
ADA535982

Entities

People

  • Dale W Schaefer
  • Peng Wang
  • Xuecheng Dong

Organizations

  • University of Cincinnati

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Advanced Materials
  • Aluminum Alloys
  • Aluminum Oxides
  • Anodic Polarization
  • Corrosion Inhibition
  • Data Analysis
  • Diffraction
  • Electrons
  • High Temperature
  • Hydrophobic Properties
  • Materials
  • Measurement
  • Metal Films
  • Physical Vapor Deposition
  • Protons
  • Scattering
  • Thin Films

Readers

  • Atmospheric Science / Meteorology, specifically Wind Wave Turbulence.
  • Organic Chemistry
  • Surface Coatings Technology.