In Situ Metrology for the Corrective Polishing of Replicating Mandrels

Abstract

The International X-ray Observatory (IXO) will require mandrel metrology with extremely tight tolerances on mirrors with up to 1.6 meter radii. Metrology on these shapes using conventional interferometry is difficult. A system that could perform in-situ metrology on the polishers may be ideal. Error budgets for the IXO mirror segments are presented. A potential solution is presented that uses a voice-coil controlled gauging head, air bearings, novel probes, and temperature control.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jun 08, 2010
Accession Number
ADA536561

Entities

People

  • Dan Thompson
  • Dave Youden
  • John Kelchner

Tags

DTIC Thesaurus Topics

  • Abstracts
  • Bearings
  • Department Of Defense
  • Dynamic Range
  • Gas Bearings
  • Information Operations
  • Interferometry
  • Manufacturing
  • Materials
  • Metrology
  • Observatories
  • Polishing
  • Space Flight
  • Standards
  • Temperature Control
  • X Rays

Fields of Study

  • Physics

Readers

  • Manufacturing Engineering.
  • Optical Fiber Sensing and Electromagnetic Propagation.
  • Systems Analysis and Design