Super-resolving Properties of Metallodielectric Stacks

Abstract

We show that diffraction can be suppressed in a realistic one-dimensional metallodielectric stack (MDS) at visible wavelengths to achieve super-resolution imaging. In our calculations we use two popular techniques, which can be adapted to investigate the imaging properties of MDSs. The two methods are the transfer matrix method (TMM) and the Finite element method (FEM) and they are compared with one another for consistency, when possible. We demonstrate the robustness and reliability of the full vector nature FEM without omitting the scattered fields and executed using appropriate boundary conditions. Our designs use material parameters taken from measured data and we use structures that can be achieved with the current state of art in nanofabrication technology. Calculations and experiments show that MDSs composed of periodic films, have a high signal throughput and are excellent candidates for widely tunable super-resolution devices.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 2010
Accession Number
ADA540223

Entities

People

  • Jean-bosco Serushema
  • Joseph Haus
  • Michael Scalora
  • Nkorni Katte

Organizations

  • United States Army Research, Development and Engineering Command

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Absorption Coefficients
  • Band Gaps
  • Crystal Structure
  • Dielectric Permittivity
  • Dielectric Properties
  • Diffraction
  • Electromagnetic Fields
  • Energy Bands
  • Magnetic Fields
  • Materials
  • Materials Science
  • Negative Index Metamaterials
  • Optical Properties
  • Photonic Crystals
  • Refractive Index
  • Simulations
  • Waves

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Optical Physics and Photonics.