High Performance and Highly Reliable ZnO Thin Film Transistor Fabricated by Atomic Layer Deposition for Next Generation Displays
Abstract
In this study, ZnO thin-film transistors (TFTs) were fabricated using channel layers deposited by plasma assisted ALD (PA-ALD) at low temperature. During the research high-performance ZnO TFTs were obtained by reducing residual carrier concentrations.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 19, 2011
- Accession Number
- ADA547983
Entities
People
- Yukiharu Uraoka
Organizations
- Nara Institute of Science and Technology