Use of Advanced Characterization Techniques to Study Structural and Compositional Transitions Across Solid State Interfaces (Preprint)
Abstract
The atomic-scale study of solid-solid interfaces in complex multi-phase multi-component systems is a challenging but important endeavor. This article highlights the coupling of recently developed advanced characterization techniques, such as high resolution scanning transmission electron microscopy (HRSTEM), carried out in an aberration-corrected microscope, and 3D atom probe (3DAP) tomography, to address the structural and compositional transition at the atomic scale across solid-solid interfaces, such as the gamma/gamma interface in Ni-base superalloys and the alpha/beta interface in titanium alloys. Possible implications of such investigations of the interface on the understanding of physical and mechanical properties are discussed.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 2011
- Accession Number
- ADA548403
Entities
People
- G. B. Viswanathan
- H.L. Fraser
- J. Y. Hwang
- Jaimie S. Tiley
- R. Banerjee
- R. Srinivasan
- S. Nag
Organizations
- Air Force Research Laboratory