Micro-Tensile Testing and 3D-EBSD Characterization of Pure Nickel Multi-Crystals (Preprint)

Abstract

A dual beam focused ion beam-scanning electron microscope (DB FIB-SEM) outfitted with an electron backscatter diffraction (EBSD) system was applied to characterize the internal microstructure and local lattice rotations within multi-crystal micro-scale test samples. The methodology outlined in this paper provides a high-fidelity 3D characterization of the internal grain structure of mechanical test samples in conjunction with knowledge of the external boundary conditions and measurement of the resultant stress-strain behavior, as well as characterization of the internal lattice rotations that have developed.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Nov 01, 2011
Accession Number
ADA553437

Entities

People

  • Christopher Woodward
  • Dennis M. Dimiduk
  • Michael A. Groeber
  • Michael D. Uchic
  • Paul A. Shade
  • Robert W. Wheeler
  • Todd J. Turner
  • Yoon-suk Choi

Organizations

  • Air Force Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Air Force Facilities
  • Air Force Research Laboratories
  • Boundaries
  • Diffraction
  • Electron Microscopes
  • Electrons
  • Ion Beams
  • Ions
  • Microscopes
  • Microstructure
  • Military Research
  • Rotation
  • Scanning Electron Microscopes
  • Structural Components
  • Tensile Testing
  • Three Dimensional

Readers

  • Materials Science and Engineering.
  • Nanoscale Plasmonic Nanotechnology
  • Powder metallurgy of Titanium alloys.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems