Atom Chips on Direct Bonded Copper Substrates (Postprint)
Abstract
We present the use of direct bonded copper (DBC) for the straightforward fabrication of high power atom chips. Atom chips using DBC have several benefits: excellent copper/substrate adhesion, high purity, thick (greater than 100 microns) copper layers, high substrate thermal conductivity, high aspect ratio wires, the potential for rapid (less than 8 h) fabrication, and three-dimensional atom chip structures. Two mask options for DBC atom chip fabrication are presented, as well as two methods for etching wire patterns into the copper layer. A test chip, able to support 100 A of current for 2 s without failing, is used to determine the thermal impedance of the DBC. An assembly using two DBC atom chips is used to magnetically trap laser cooled 87Rb atoms. The wire aspect ratio that optimizes the magnetic field gradient as a function of power dissipation is determined to be 0.84:1 (height:width).
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 19, 2012
- Accession Number
- ADA556390
Entities
People
- Evan J. Carlson
- James Stickney
- Matthew B Squires
- Paul M. Baker
- Sandra Wentzell
- Steven M. Miller
- Walter R. Buchwald
Organizations
- Air Force Research Laboratory