Structural Consequences of Ferroelectric Nanolithography

Abstract

Domains of remnant polarization can be written into ferroelectrics with nanoscale precision using scanning probe nanolithography techniques such as piezoresponse force microscopy (PFM). Understanding the structural effects accompanying this process has been challenging due to the lack of appropriate structural characterization tools. Synchrotron X-ray nanodiffraction provides images of the domain structure written by PFM into an epitaxial Pb(Zr,Ti)O3 thin film and simultaneously

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2011
Accession Number
ADA558009

Entities

People

  • Chang-Beom Eom
  • Ji Young Jo
  • Joerg Maser
  • Kenneth Evans-lutterodt
  • Martin V Holt
  • Nina Balke
  • Paul G. Evans
  • Pice Chen
  • Rebecca J. Sichel
  • Ryan T. Smith
  • Sergei V. Kalinin
  • Seung-hyub Baek

Organizations

  • University of Wisconsin–Madison

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Diffraction
  • Distortion
  • Domain Walls
  • Electric Fields
  • Films
  • Free Energy
  • Fresnel Zones
  • Magnetic Domains
  • Materials
  • Materials Science
  • Nanolithography
  • Nanomaterials
  • Scattering
  • Thin Films
  • United States
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Nanofabrication and Microfabrication.
  • Systems Analysis and Design