Low Work Function Csl Coatings for Enhanced Field Emission Properties
Abstract
Thin films of Cesium Iodide (CsI) were deposited by pulse laser deposition and by thermal evaporation on Si substrates and were characterized by XRD, XPS, UPS, and Kelvin probe measurements. The thermally evaporated films were found to be stoichiometric whereas the pulsed laser deposited PLD films showed the presence of a Cs/CsI mixture. The latter is supported by UPS measurements whose Fermi edge indicated the presence of a metallic component (elemental Cs). The presence of a CsI/Cs mixture is also supported by the Kelvin probe work function values found to be in the range of 2.6-2.8 eV, a value in excess of the 2.1 eV reported for elemental Cs. This paper addresses the physical mechanisms responsible for the presence of the elemental Cs in the films and its ramification to their field emission properties.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 2011
- Accession Number
- ADA559025
Entities
People
- D. Shiffler
- M. Cahay
- P. T. Murray
- Steven B. Fairchild
- T. C. Back
Organizations
- Air Force Research Laboratory