An Automated Multi-Modal Serial Sectioning System for Characterization of Grain-Scale Microstructures in Engineering Materials (Preprint)

Abstract

This paper describes the development of a new serial sectioning system that has been designed to collect microstructural, crystallographic, and chemical information from volumes in excess of 1 cu mm. The system integrates a robotic multi-platen mechanical polishing system with a modern SEM that enables the acquisition of multi-modal data--scanning electron images, EBSD and hyperspectral EDS map--at each section. Selected details of the system construction as well as an initial demonstration of the system capabilities are presented.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 2012
Accession Number
ADA559110

Entities

People

  • Adam Shiveley
  • Jonathan Spowart
  • Megna N Shah
  • Michael G Chapman
  • Michael Groeber
  • Michael Scott
  • Michael Uchic
  • Patrick G. Callahan

Organizations

  • Air Force Research Laboratory

Tags

Communities of Interest

  • Autonomy

DTIC Thesaurus Topics

  • Air Force
  • Air Force Facilities
  • Air Force Research Laboratories
  • Electron Microscopes
  • Electrons
  • Engineering
  • Government Procurement
  • Governments
  • Manufacturing
  • Materials
  • Materials Science
  • Microscopes
  • Microscopy
  • Microstructure
  • Military Research
  • Polishing
  • United States

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Distributed Systems and Data Platform Development
  • Powder metallurgy of Titanium alloys.

Technology Areas

  • AI & ML
  • AI & ML - Autonomous Systems
  • Autonomy
  • Microelectronics