Radiation Effects Research and Device Evaluation
Abstract
The purpose of this basic research effort was to develop a systematic approach to determining radiation sensitivity in organic semiconductor based devices, including particularly photo-voltaics but also evaluating and characterizing organic based diodes, transistors including field effect devices and basic structures. The scope of the effort included both an experimental component that included application of accelerated testing with both ionizing radiation and elevated temperatures, as well as a modeling component to understand and confirm degradation mechanisms. The findings included the discovery that carrier lifetimes were unaffected by ionizing radiation but degradation manifested itself in the development of an internal potential that tended to reduce efficiency of the organic photovoltaic devices tested. This conclusion, along with any recommendations, will be utilized by device fabricators to attempt a mitigation scheme.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 04, 2012
- Accession Number
- ADA559901
Entities
People
- Clay Mayberry
Organizations
- Air Force Research Laboratory