Compressed Sensing and Electron Microscopy

Abstract

Compressed Sensing (CS) is a relatively new approach to signal acquisition which has as its goal to minimize the number of measurements needed of the signal in order to guarantee that it is captured to a prescribed accuracy. It is natural to inquire whether this new subject has a role to play in Electron Microscopy (EM). In this paper, we shall describe the foundations of Compressed Sensing and then examine which parts of this new theory may be useful in EM.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2010
Accession Number
ADA560915

Entities

People

  • Daniel Savu
  • Peter Binev
  • Philipp Lamby
  • Robert Sharpley
  • Ronald DeVore
  • Wolfgang Dahmen

Organizations

  • University of South Carolina

Tags

Communities of Interest

  • Air Platforms
  • Energy and Power Technologies
  • Sensors

DTIC Thesaurus Topics

  • Accuracy
  • Acquisition
  • Algorithms
  • Coding
  • Compressed Sensing
  • Data Acquisition
  • Decoding
  • Detectors
  • Electron Microscopes
  • Electron Microscopy
  • Electrons
  • High Resolution
  • Image Processing
  • Measurement
  • Microscopy
  • Random Variables
  • Three Dimensional

Readers

  • Image Processing and Computer Vision.
  • Theoretical Analysis.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics