On the Through-Thickness Critical Current Density of an YBa2Cu3O7-x Film Containing a High Density of Insulating, Vortex-Pinning Nanoprecipitates (Postprint)
Abstract
Using sequential ion milling the authors have studied the thickness dependence of the critical current density Jc(H) of a single crystal 1 micron thick YBa2Cu3O7-x thin film containing 5 vol % of insulating Y2BaCuO5 (Y211) nanoparticles in order to better understand how to obtain high critical currents in thick films. Except very near the interface where the defect density was enhanced, Jc(H) in the body of the film was uniform and independent of thickness with a high maximum pinning force of 8.8 GN/m3 at 77 K. The authors conclude that the nanoscale Y211 precipitates result in strong, three-dimensional pinning characterized by a pin spacing of ~30 nm, much smaller than the film thickness.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 18, 2007
- Accession Number
- ADA562219
Entities
People
- A. Gurevich
- D. C. Larbalestier
- F. Kametani
- P. Barnes
- S. I. Kim
- Timothy J. Haugan
- Zexun Chen
Organizations
- Air Force Research Laboratory