Transport Imaging for Contact-Free Measurements of Minority Carrier Diffusion in GaN, GaN/AlGaN, and GaN/InGaN Core-Shell Nanowires

Abstract

Minority carrier diffusion lengths (Ld) are measured for GaN, GaN/AlGaN, and aN/InGaN core-shell nanowires using a technique based on imaging of recombination luminescence. The effect of shell material on transport properties is measured. An AlGaN shell produces Ld values in excess of 1 micrometer and a relative insensitivity to wire diameter. An InGaN shell reduces effective diffusion length, while a dependence of Ld on diameter is observed for uncoated nanowires.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2011
Accession Number
ADA562409

Entities

People

  • A. A. Talin
  • C. P. Ong
  • George T. Wang
  • Lee Baird
  • N. M. Haegel
  • Qiming Li
  • R. A. Cole

Organizations

  • Naval Postgraduate School

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Carrier Mobility
  • Compound Semiconductors
  • Diffusion
  • Electron Beams
  • Electron Microscopes
  • Energy Bands
  • Materials
  • Measurement
  • Microscopy
  • Minority Groups
  • Nanomaterials
  • Nanostructures
  • Nanowires
  • Near Field
  • Physics
  • Scanning Electron Microscopes
  • Transport Ships

Fields of Study

  • Materials science

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Semiconductor Device Technology