Long-Wave Infrared Semiconductor Negative Refraction Metamaterials for High-Resolution Imaging

Abstract

The authors have theoretically developed and experimentally verified a set of multilayered metamaterials with negative refraction response spanning the frequency range 8...11 microns (frequency-independent index spanning 8...9.5 microns), leading to the increase of bandwidth of negative refraction by 27%. They also designed and fabricated quantum cascade structures integrated into semiconductor metamaterials; experimental characterization indicates QC action spectrally overlapping with negative refraction region. Finally, the authors theoretically developed a system that is capable of achieving focal spots of the order of 1 micron, and a new analytical technique that can be utilized to image subwavelength objects in the far field.

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Document Details

Document Type
Technical Report
Publication Date
Feb 14, 2011
Accession Number
ADA563961

Entities

People

  • Claire Gmachl

Organizations

  • Princeton University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Data Storage Systems
  • Diffraction
  • Electrical Engineering
  • Electromagnetic Metamaterials
  • Electronic Mail
  • Far Field
  • Finite Element Analysis
  • Fresnel Zones
  • Geometry
  • Long-Wavelength Infrared Radiation
  • Materials Science
  • Near Field
  • Optical Properties
  • Optics
  • Scattering
  • Surface Plasmon Polaritons
  • Three Dimensional

Fields of Study

  • Materials science
  • Physics

Readers

  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Image Processing and Computer Vision.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.

Technology Areas

  • Microelectronics
  • Quantum Computing