A Reliability Study of RFID Technology in a Fading Channel

Abstract

RFID systems are an important component in the effort to increase the efficiencies of the logistics supply chain for the U.S. Department of Defense. While the U.S. DoD has mandated the use of RFID tags for its suppliers, the technology has not always kept up with the performance expectations. This study explores new modulation and coding techniques to possibly be used in the improvement of the read reliability of RFID systems. Bit and tag error probabilities are computed for various OOK and M-CSK modulation schemes in a varying Nakagamim fading channel, and the best performing schemes are identified for future employment.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 2007
Accession Number
ADA574393

Entities

People

  • Kyle M. Beilke

Organizations

  • Naval Postgraduate School

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Data Analysis
  • Data Rate
  • Department Of Defense
  • Frequency
  • Gaussian Noise
  • Line Of Sight
  • Modulation
  • Orientation (Direction)
  • Probability
  • Probability Density Functions
  • Probability Distributions
  • Random Variables
  • Reliability
  • Standards
  • United States
  • United States Naval Academy
  • Walsh Functions

Fields of Study

  • Engineering

Readers

  • Defense Acquisition Program Management
  • Radio communications and signal processing.