Binary Versus Decade Inductive Voltage Divider Comparison and Error Decomposition

Abstract

An automatic Inductive Voltage Divider (IVD) characterization method that can measure linearity by comparing IVD's with different structures is suggested. Structural models are employed to decompose an error vector into components that represent each divider. Initial tests at 400 Hz show that it is possible to assign independent errors due to the binary and decade structures with a 2 sigma uncertainty of 0.05 parts per million (ppm) at the measured ratio values.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1995
Accession Number
ADA575003

Entities

People

  • Andrew D. Koffman
  • Gerard N. Stenbakken
  • Nile M. Oldham
  • Robert W. Gammon
  • Svetlana Avramov-Zamurovic

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Automatic
  • Coefficients
  • Decomposition
  • Electrical Engineering
  • Engineering
  • Errors
  • Instrumentation
  • Linearity
  • Maryland
  • Measurement
  • Networks
  • Semiconductor Devices
  • Standards
  • Uncertainty
  • United States Naval Academy
  • Universities
  • Voltage Dividers

Readers

  • Computational Modeling and Simulation
  • Computer Programming and Software Development.
  • Electrical Engineering