Evaluation of Carbon Nanotube Thin Films for Optically Transparent Microwave Applications Using On-Wafer Probing of Corbino Disc Test Structures

Abstract

We present a generalized technique, involving the on-wafer probing of Corbino disc test structures, for conveniently evaluating conducting films of arbitrary thickness in terms of complex conductivity and related physical parameters. Using this method, we have electrically characterized partially transparent carbon nanotube thin films at DC and microwave frequencies (including the L-, S- and C-bands). Test structures with disc diameters ranging from ~50 m to 500 m and disc-to-concentric-ring gaps ranging from ~30 m to 150 m were investigated at temperatures ranging from (295.85 +/- 0.62) K to (396.75 +/- 0.72) K. Additionally, we characterized the thin film in terms of its room temperature optical transmission, at wavelengths ranging from 200 to 2500 nm, in order to evaluate this material as an optically transparent microwave conductor.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 2013
Accession Number
ADA575885

Entities

People

  • Clifford W. Hubbard
  • Eric H. Ngo
  • Henning Richter
  • Julia B. Doggett
  • Mathew P. Ivill
  • Ramesh Sivarajan
  • Ryan C. Toonen
  • S. G. Hirsch

Organizations

  • United States Army Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Accuracy
  • C Band
  • Carbon Nanotubes
  • Conductivity
  • Diameters
  • Engineering
  • Frequency
  • Fullerenes
  • Materials
  • Materials Processing
  • Measurement
  • Microwave Frequency
  • Physical Properties
  • Thick Films
  • Thickness
  • Thin Films
  • Transmission Lines

Readers

  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design
  • Thin Film Deposition Science.