High Speed Imaging using Nanoprobe Arrays

Abstract

The goal of the research was to demonstrate a revolutionary advancement in nanometer-scale imaging, using an array of atomic force microscope cantilever tips to image an area of unprecedented size. The key technical challenge in large are nanoimaging is to develop scalable cantilever arrays where each cantilever can be independently actuated and sensed.

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Document Details

Document Type
Technical Report
Publication Date
Jun 23, 2010
Accession Number
ADA577613

Entities

People

  • William P King

Organizations

  • University of Illinois Urbana–Champaign

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Data Storage Systems
  • Detection
  • Detectors
  • Electrical Resistance
  • Electronics Laboratories
  • Fabrication
  • Heat Transfer
  • Measurement
  • Mechanical Properties
  • Microelectromechanical Systems
  • Microscopy
  • Military Research
  • P-N Junction Diodes
  • P-N Junctions
  • Power Electronics
  • Semiconductors
  • Two Dimensional

Fields of Study

  • Physics

Readers

  • Nanoscale Plasmonic Nanotechnology