Carbon Nanotube Oscillator Surface Profiling Device and Method of Use

Abstract

The proposed device is based on a carbon nanotube oscillator consisting of a finite length outer stationary nanotube and a finite length inner oscillating nanotube. Its main function is to measure changes in the characteristics of the motion of the carbon nanotube oscillating near a sample surface, and profile the roughness of this surface. The device operates in a non-contact mode, thus it can be virtually non-wear and non-fatigued system. It is an alternative to the existing atomic force microscope (AFM) tips used to scan surfaces to determine their roughness.

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Document Details

Document Type
Technical Report
Publication Date
Nov 15, 2011
Accession Number
ADA581574

Entities

People

  • Adrian Popescu
  • Igor V Bondarev
  • Lilia M Woods

Organizations

  • North Carolina College

Tags

DTIC Thesaurus Topics

  • Acoustic Waves
  • Carbon Nanotubes
  • Coefficients
  • Detectors
  • Diameters
  • Frequency
  • Friction
  • Fullerenes
  • Graphene
  • Inner Tubes
  • Laser Beams
  • Nanotechnology
  • North Carolina
  • Patent Applications
  • Patents
  • Physical Properties
  • United States

Fields of Study

  • Physics

Readers

  • Atmospheric Remote Sensing.
  • Control Systems Engineering.
  • Nanoscale Plasmonic Nanotechnology