Carbon Nanotube Oscillator Surface Profiling Device and Method of Use
Abstract
The proposed device is based on a carbon nanotube oscillator consisting of a finite length outer stationary nanotube and a finite length inner oscillating nanotube. Its main function is to measure changes in the characteristics of the motion of the carbon nanotube oscillating near a sample surface, and profile the roughness of this surface. The device operates in a non-contact mode, thus it can be virtually non-wear and non-fatigued system. It is an alternative to the existing atomic force microscope (AFM) tips used to scan surfaces to determine their roughness.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 15, 2011
- Accession Number
- ADA581574
Entities
People
- Adrian Popescu
- Igor V Bondarev
- Lilia M Woods
Organizations
- North Carolina College