Significantly Improved Minority Carrier Lifetime Observed in a Long-Wavelength Infrared III-V Type-II Superlattice Comprised of InAs/InAsSb
Abstract
Time-resolved photoluminescence measurements reveal a minority carrier lifetime of greater than 412 ns at 77K under low excitation for a long-wavelength infrared InAs/InAs0.72Sb0.28 type-II superlattice (T2SL). This lifetime represents an order-of-magnitude increase in the minority carrier lifetime over previously reported lifetimes in long-wavelength infrared InAs/Ga1-xInxSb T2SLs. The considerably longer lifetime is attributed to a reduction of non-radiative recombination centers with the removal of Ga from the superlattice structure. This lifetime improvement may enable background limited T2SL long-wavelength infrared photodetectors at higher operating temperatures.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 22, 2011
- Accession Number
- ADA581737
Entities
People
- A. W. Liu
- B. C. Connelly
- D. Lubyshev
- Elizabeth H. Steenbergen
- G. D. Metcalfe
- Haoting Shen
- J. M. Fastenau
- M. Wraback
- O. O. Cellek
- S. Elhamri
- Y. Qiu
- Y.-h. Zhang
Organizations
- University of Illinois Urbana–Champaign