Single-Qubit-Gate Error below 0.0001 in a Trapped Ion

Abstract

With a (9)Be(+) trapped-ion hyperfine-states qubit, we demonstrate an error probability per randomized single-qubit gate of 2.0(2) x 10(-5) below the threshold estimate of 10(-4) commonly considered sufficient for faulttolerant quantum computing. The (9)Be(+) ion is trapped above a microfabricated surface-electrode ion trap and is manipulated with microwaves applied to a trap electrode. The achievement of low single-qubit-gate errors is an essential step toward the construction of a scalable quantum computer.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2011
Accession Number
ADA582557

Entities

People

  • A. C. Wilson
  • A. M. Meier
  • C. Ospelkaus
  • D. J. Wineland
  • D. Leibfried
  • E. Knill
  • Kenton R. Brown
  • Y Colombe

Organizations

  • Massachusetts Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Calibration
  • Computers
  • Detection
  • Field Programmable Gate Arrays
  • Frequency
  • Ground State
  • Ion Traps
  • Lasers
  • Magnetic Fields
  • Magnetic Resonance
  • Measurement
  • Nuclear Magnetic Resonance
  • Quantum Bits
  • Quantum Computers
  • Quantum Computing
  • Quantum Information
  • Quantum Information Science

Fields of Study

  • Physics

Readers

  • Adaptive Control and Estimation with Uncertainty in Dynamic Systems.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Quantum spin resonance or Electron Paramagnetic Resonance spectroscopy.

Technology Areas

  • Quantum Computing