Metalorganic Vapor Phase Epitaxial Growth of (211)B CdTe on Nanopatterned (211)Si
Abstract
Low-defect density epitaxial CdTe on Si is very crucial for fabricating high performance HgCdTe IR focal planar arrays on Si. This paper discusses a novel nanopatterning technique to explore defect reduction in CdTe epitaxy on (211)Si. Nanopatterning of full 3" (211)Si wafers was done by growing a thin layer of thermal SiO2 and patterning by molecular transfer lithography (MxL) based on water-soluble templates. Conditions for obtaining selective Ge
Document Details
- Document Type
- Technical Report
- Publication Date
- May 15, 2012
- Accession Number
- ADA590790
Entities
People
- Charles Schaper
- Fred Semendy
- Ishwara Bhat
- Priyalal Wijewarnasuriya
- Shashidhar Shintri
- Sudhir Trivedi
- Sunil G. Rao
- W. PaĆosz
Organizations
- United States Army Research Laboratory