Laser Beam Induced Current (LBIC) Study of IR Detector Materials

Abstract

Summary of activities and results: 1. Demonstration of IR-LBIC spatial mapping of a MCT-FPA device using a 1450nm laser from both back and front sides; 2. Unusual LBIC spatial mapping results of a MCT-FPA device from the front (electrode) side using a 532nm laser; 3. Demonstration of LBIC spatial mapping of an InAs/GaSb IR detector using a 532 nm laser at 10 K; 4. PL spatial mapping of an isolated dislocation in GaAs, leading to general understanding of the interplay between point and extended defects on carrier diffusion in semiconductors; 5. PL spatial mapping of Cd le epilayers with different growth conditions; 6. PL spatial mapping of ZnTe epilayers with different growth conditions, from front surface and cleaved edge; 7. MCT epilayer transmission and reflection measurements.

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Document Details

Document Type
Technical Report
Publication Date
Mar 12, 2013
Accession Number
ADA592573

Entities

People

  • Yong Zhang

Organizations

  • University of North Carolina at Charlotte

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Department Of Defense
  • Detection
  • Detectors
  • Images
  • Infrared Detectors
  • Laser Beams
  • Lasers
  • Materials
  • Measurement
  • Optical Images
  • Point Defects
  • Quantum Efficiency
  • Raman Spectra
  • Semiconductors
  • Spectra
  • Spectroscopy
  • Two Dimensional

Fields of Study

  • Materials science

Readers

  • Ocean-Atmosphere Mesoscale Modeling, Data Assimilation, and Flux Boundary Layers
  • Semiconductor Device Technology

Technology Areas

  • Directed Energy
  • Microelectronics