Tuning the Performance of Organic Spintronic Devices Using X-Ray Generated Traps
Abstract
X rays produced during electron-beam deposition of metallic electrodes drastically change the performance of organic spintronic devices. The x rays generate traps with an activation energy of ~0.5 eV in a commonly used organic. These traps lead to a dramatic decrease in spin-diffusion length in organic spin valves. In organic magnetoresistive (OMAR) devices, however, the traps strongly enhance magnetoresistance. OMAR is an intrinsic magnetotransport phenomenon and does not rely on spin injection. We discuss our observations in the framework of currently existing theories.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 16, 2012
- Accession Number
- ADA593012
Entities
People
- Chuanlin He
- F. Wang
- J. Rybicki
- M. Wohlgenannt
- Ruiyang Lin
- T. Sanders
- Y. Suzuki
Organizations
- University of Iowa