A Characterization of t/s-Diagnosability and Sequential t-Diagnosability in Designs

Abstract

A multiprocessing system is t/s-diagnosable if all faulty processors can be identified to within s processors provided there are no more than t faulty processors. A characterization theorem of Karunanithi and Friedman [4] for t/s-diagnosability in certain special cases of systems called designs is extended to the entire class of D(sub 1), t'(n) designs. We show that for large t , s is approximately t2/4t'. Furthermore, the minimum number of processors needed to attain a given diagnosability is derived. A multiprocessor system is sequentially t-diagnosable if at least one faulty processor can be identified provided there are no more than t faulty processors. A theorem by Preparata, Metze, and Chien [7] giving a sufficient condition for sequential t-diagnosability in the single loop system, a special case of designs, is extended to the entire class of D(sub 1), t'(n) designs. We show that, for large t, approximately t2/4t' nodes are needed for a D(sub 1), t'(n) design to be sequentially t-diagnosable.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1990
Accession Number
ADA593565

Entities

People

  • Jon T. Butler
  • Joo-kang Lee

Organizations

  • Naval Postgraduate School

Tags

Communities of Interest

  • C4I
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Algorithms
  • Computational Science
  • Computations
  • Computer Science
  • Computers
  • Detection
  • Differential Equations
  • Engineering
  • Equations
  • Index Terms
  • Indexes
  • Markov Chains
  • Markov Processes
  • Multiprocessors
  • New York
  • Signal Processing
  • Stochastic Processes

Fields of Study

  • Mathematics

Readers

  • Calculus or Mathematical Analysis
  • Fault Tolerant Diagnosis of Black and White Balloon Isolation Tests Using ¥.
  • Parallel and Distributed Computing.