Establishing Measurement Uncertainty for the Digital Temperature Scanner Using Calibration Data
Abstract
This report documents a methodology to compute the measurement uncertainty for a family of digital temperature scanners using as-found calibration data. Two methods for analyzing the DC voltage measurement calibration errors are described: (1) a lumped method which pools all errors into a single population without regard to input voltage level and (2) a grouped method which separates errors according to the input voltage level. The lumped method has the advantage of establishing a single measurement uncertainty for measurements made at any input level. The disadvantage is that the measurement uncertainty is valid only near midscale because of gain errors that bias the uncertainty calculations. The grouped method s advantage overcomes the disadvantages of the lumped method by presenting measurement uncertainty as a percent of reading format. The disadvantage is additional complexity in computing measurement uncertainty as a function of input voltage level.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 2013
- Accession Number
- ADA594984
Entities
People
- James L. Taylor
Organizations
- Arnold Engineering Development Complex