Theory of Near-Field Scanning with a Probe Array
Abstract
In near-field scanning, as the electrical size of a device under test increases, it becomes increasingly time-consuming to collect all the required near-field samples using a single probe. Thus, it becomes desirable to use an array of probes to collect the near-field samples simultaneously to decrease the measurement time. We consider some of the electromagnetic issues associated with performing near-field measurement using an array of probes for antenna and bistatic radar cross section (RCS) applications.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 2014
- Accession Number
- ADA595015
Entities
People
- Bradley A. Kramer
- Hans Steyskal
- John A. Schindler
- Kristopher T. Kim
Organizations
- Air Force Research Laboratory