Chemically Resolved Interface Structure of Epitaxial Graphene on SiC(0001)
Abstract
Atomic-layer 2D crystals have unique properties that can be significantly modified through interaction with an underlying support. For epitaxial graphene on SiC(0001), the interface strongly influences the electronic properties of the overlaying graphene. We demonstrate a novel combination of x-ray scattering and spectroscopy for studying the complexities of such a buried interface structure. This approach employs x-ray standing wave-excited photoelectron spectroscopy in conjunction with x-ray reflectivity to produce a highly resolved chemically sensitive atomic profile for the terminal substrate bilayers, interface, and graphene layers along the SiC[0001] direction.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 19, 2013
- Accession Number
- ADA605574
Entities
People
- Blanka Detlefs
- D. Kurt Gaskill
- Hunter J. Karmel
- Joerg Zegenhagen
- Jonathan D. Emery
- Luke O. Nyakiti
- Mark Hersam
- Michael Bedzyk
Organizations
- Northwestern University