Piezoresistive Transduction in Multilayer Polycrystalline Silicon Resonators
Abstract
We demonstrate piezoresistive transduction of mechanical motion from out-of-plane flexural micromechanical resonators made from stacked thin films. The resonators are fabricated from two highly doped polycrystalline silicon layers separated by an interlayer dielectric. We examine two interlayer materials: thermal silicon dioxide and stoichiometric silicon nitride. We show that via one-time dielectric breakdown, the film stack functions as a vertical piezoresistor effectively transducing the motion of the resonators. We obtain a gauge factor of 5, which is sufficient to detect the resonator motion. The simple film stack constitutes a vertically oriented piezoresistor that is readily integrated with micro- and nanoscale resonators.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 2009
- Accession Number
- ADA609193
Entities
People
- B. R. Ilic
- Brian H. Houston
- H. G. Craighead
- J. D. Cross
- J. M. Parpia
- J. W. Baldwin
- M. K. Zalalutdinov
- Weibin Zhou
Organizations
- United States Naval Research Laboratory