Localized Excited Charge Carriers Generate Ultrafast Inhomogeneous Strain in the Multiferroic BiFeO3

Abstract

We apply ultrafast x-ray diffraction with femtosecond temporal resolution to monitor the lattice dynamics in a thin film of multiferroic BiFeO3 after above-band-gap photoexcitation. The sound-velocity limited evolution of the observed lattice strains indicates a quasi-instantaneous photoinduced stress which decays on a nanosecond time scale. This stress exhibits an inhomogeneous spatial profile evidenced by the broadening of the Bragg peak. These new data require substantial modification of existing models of photogenerated stresses in BiFeO3: the relevant excited charge carriers must remain localized to be consistent with the data.

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Document Details

Document Type
Technical Report
Publication Date
Mar 03, 2014
Accession Number
ADA610621

Entities

People

  • Carolina Adamo
  • Daniel Schick
  • Darrell G. Schlom
  • Haidan Wen
  • Marc Herzog
  • Matias Bargheer
  • Paul G. Evans
  • Peter Gaal
  • Pice Chen
  • Yuelin Li

Organizations

  • Cornell University

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Band Gaps
  • Carrier Mobility
  • Charge Carriers
  • Diffraction
  • Electrons
  • Energy Bands
  • Films
  • Lattice Dynamics
  • Materials
  • Materials Science
  • Measurement
  • Nanosecond Time
  • Piezoelectric Effect
  • Simulations
  • Thin Films
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Mechanical Engineering/Mechanics of Materials.
  • Optical Physics and Photonics.