Memristive Responses of Jammed Granular Copper Array Sensors to Mechanical Stress

Abstract

A granular memristive device with the end goal of creating a novel system protection device is introduced in a 1-Dimension array. The electromechanical network will lay the groundwork for future 2-Dimensional and 3-Dimensional devices for simultaneous protection from intrusion. Off the shelf copper spheres with diameter of 710 +/- 11microns were found through nano-indentation measurements to have elastic modulus of 106GPa, and compressive yield strength of 729MPa, these spheres were prepared for test in a 1-Dimensional array device. The arrays response to mechanical perturbations modeled by Hertz contact mechanics can be monitored by simultaneous electrical measurements across the multiple metal-insulator-metal junctions. A shift in the nonlinear IV trace behavior to lower resistance states is the result of increasing compressive forces. Additionally a relation of breakdown to ohmic conduction of the junctions is found to be -7.6 in units of Volts per Newton per Interface for a 15 minute thermally oxidized sample array of 4 spheres. This granular array can be preset and monitored retaining the ability to recognize mechanical or electrical interference. The ability to have multiple electromechanically characterized chains within a 3-Dimensional volume allows for a complex redundancy in the future system protection circuit.

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Document Details

Document Type
Technical Report
Publication Date
Mar 27, 2014
Accession Number
ADA611821

Entities

People

  • Gary A. Willey Jr.

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Crystal Lattices
  • Detectors
  • Dielectrics
  • Electrical Measurement
  • Electrical Properties
  • Geometry
  • Materials
  • Materials Science
  • Measurement
  • Mechanical Properties
  • Mechanics
  • Modulus Of Elasticity
  • Surface Properties
  • Three Dimensional
  • Two Dimensional
  • Yield Strength

Readers

  • Electrical Engineering
  • Mechanical Engineering/Mechanics of Materials.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems