Measuring Refractive Index Using the Focal Displacement Method (Postprint)

Abstract

A simple technique is introduced for measuring the refractive index of plane-parallel samples having thickness of the order of a millimeter. The refractive index values are reported for six bulk semiconductors, each index measured at two infrared wavelengths using this method. The values are found to be within a few percent of those in literature for four semiconductors. The other two semiconductors were newly grown ternary alloys (CdMgTe and CdMnTe), for which the refractive index values have not been reported previously at the wavelengths studied here.

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Document Details

Document Type
Technical Report
Publication Date
May 01, 2014
Accession Number
ADA611871

Entities

People

  • Jacob O. Barnes
  • Jean Wei
  • Joel M. Murray
  • Jonathan E. Slagle
  • Shekhar Guha

Organizations

  • Air Force Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Accuracy
  • Air Force
  • Air Force Research Laboratories
  • Detectors
  • Displacement
  • Electronics
  • Laser Beams
  • Lasers
  • Literature
  • Materials
  • Measurement
  • Military Research
  • Optics
  • Refractive Index
  • Semiconductors
  • Standards
  • Thickness

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
  • Regression Analysis.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics