In-situ, Nanosecond, High Resolution TEM Instrumentation for Multi-Disciplinary Research and Education in Nanomaterials
Abstract
This DURIP instrumentation grant allowed us to develop new instrumentation that significantly improved experimental capabilities to characterize the mechanical properties of carbon nanotube and metallic nanowire materials. In particular, the purchased equipment included a nanomanipulator for preparation of nano-specimens for in-situ Scanning Electron Microscopy (SEM). The objective of the manipulator was to provide a sample preparation platform for specimens that will subsequently be tested by in-situ SEM or Transmission Electron Microscopy (TEM). In addition, a double-tilt, electrical biasing, TEM specimen holder was designed by us and custom fabricated. The electrical biasing capabilities allow the TEM holder to operate microelectromechanical system (MEMS) devices previously developed by our group for mechanical testing of nanostructures. The two combined instruments therefore provide a system for mechanical testing of nanostructures, combining capabilities of: (1) double-tilting in TEM for accurate structural characterization, (2) MEMS testing of nanostructures in-situ TEM, affording high resolution in loads and (3) straightforward sample preparation for TEM and SEM testing of nanostructures.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 30, 2014
- Accession Number
- ADA621807
Entities
People
- Horacio D Espinosa
Organizations
- Northwestern University